MS20: Combined Approaches for Structure Characterization of Complex Materials at Multiple Lenght Scales

  • Artem Abakumov (Skolkovo Institute of Science and Technology, Russia)
  • Lukas Palatinus (Institute of Physics of the Czech Academy of Sciences, Czech Republic)
  • Date:     Wednesday, 21. August 2019
  • Time:    10:00 - 12:00
  • Venue:  HS32

The MS is dedicated to contributions about structure characterization of complex structures including functional materials, minerals and related compounds, and about related analytical methodologies. Particular focus is given to works combining different scientific approaches, among which diffraction, microscopy, spectroscopies, the application of superspace, and local structure approaches.

10:00 MS20-01 Combined Analysis of Structure and Strain in Engineering Materials by Neutron and Synchrotron X-Ray Diffraction, and Electron Microscopy
Alexander M. Korsunsky (University of Oxford, United Kingdom) | Abstract preview
10:30 MS20-02 X-Ray Characterization of Morphology and Structure of Materials at Multiple Length Scales
Ehrenfried Zschech (Fraunhofer Institute for Ceramic Technologies and Systems, Germany) | Abstract preview
11:00 MS20-03 Characterization of Aperiodic Bi-based Layered Oxides Thin Films by TEM Multiscale Approaches
Philippe Boullay (CRISMAT - CNRS UMR 6508, France) | Abstract preview
11:20 MS20-04 Orientional Disorder in Monomethyl-Quinacridone Investigated by Rietveld Refinement, Pair-Distribution Function Analysis and Lattice-Energy Minimisations
Martin U. Schmidt (Goethe Universität, Frankfurt am Main, Germany) | Abstract preview
11:40 MS20-05 Small-angle Scattering Study for Developing Alkaline Durable Imidazolium-Based Grafted Anion Exchange Membranes for Pt-Free Fuel Cells
Yue Zhao (National Institutes for Quantum and Radiological Science and Technology, Japan) | Abstract preview